CMOS VLSI Analog Design and CMOS Image Sensors

 
  1. Y. Nemirovsky, Igor Brouk and C. G. Jakobson, 1/f Noise in CMOS Transistors for Analog Applications, IEEE Trans. on Electron Devices, Vol. 48(5), (2000) pp. 921-7.
  2. C. Jakobson, I. Bloom and Y. Nemirovsky, 1/f Noise in CMOS Transistors for Analog Applications from Subthreshold to Saturation, Solid State Electronics, 42(10), pp. 1807-1817, (1998).
  3. I. Brouk and Y. Nemirovsky, Dimensional Effects in CMOS Photodiodes, Solid State Electronics, Vol. 46 (2002), pp. 19-28.
  4. I. Bloom and Y. Nemirovsky, 1/f Noise Reduction in Metal-Oxide-Semiconductor Transistors by Cycling from Inversion to Accumulation, Appl. Phys. Lett., Vol. 58, pp. 1664-1666, 1991.
  5. L. Goldmintz and Y. Nemirovsky, Thermal Noise in Buried Channel MOSFET, IEEE Trans. on Electron Devices, 39, pp. 2325-2332, (1992).
  6. C.G. Jakobson and Y. Nemirovsky, CMOS Low Noise Switched Charge Sensitive Preamplifier for CdTe and CdZnTe X-Ray Detectors, IEEE Trans. on Nuclear Science, 44(1), pp. 20-25, (1997).
  7. C.G. Jakobson, G. Asa, S. Bar Lev, Y. Nemirovsky, Low Noise CMOS Readout for CdZnTe Detector Arrays, Nuclear Instruments and Methods in Physics Research, A 428, (1999) pp. 113-117.
  8. I. Brouk, Y. Nemirovsky, S. Lachowicz, E.A. Gluszak, S. Hinckley and K. Eshraghian, Characterization of Crosstalk between CMOS Photodiodes, Solid State Electronics, Vol. 46 (2002), pp. 53-59.
  9. I. Brouk, A. Kamal and Y. Nemirovsky, Design and characterization of CMOS Image Sensors, submitted to IEEE Trans. On Electron Devices, March 2006.
  10. Y. Nemirovsky and A. Unikovsky, Tunneling and 1/f Noise in HgCdTe Photodiodes, J. Vac. Sci. & Technology, Vol. B10(4), pp. 1602-1610, (1992).
  11. Y. Satuby, V. Ben-Yehuda, C. G. Jakobson, J. Shneider, D. Lavie and Y. Nemirovsky, Electrostatically Driven Micro Resonator with a CMOS Capacitive Read Out, The 18th Convention of Electrical Engineers in Israel, Tel-Aviv, March 1995.
  12. C. G. Jakobson, D. Lavie and Y. Nemirovsky, CMOS Low Noise Switched Charge Sensitive Preamplifier for CdTe X-Ray Detection, The 18th Convention of Electrical Engineers in Israel, Tel-Aviv, March 1995.
  13. C.G. Jakobson, I. Bloom and Y. Nemirovsky, 1/f Noise in CMOS Transistors for Analog Applications from Subthreshold to Strong Inversion, The Nineteenth Convention of Electrical and Electronics Engineers in Israel, Jerusalem, November, 1996.
  14. I. Brouk, A. Ezion and Y. Nemirovsky, Characterization of CMOS Photodiodes for Image Sensors, 11th International Meeting on Electro-Optics in Israel, November 9-11, 1999, Tel-Aviv, Israel.
  15. I. Brouk and Y. Nemirovsky, 1/f Noise in CMOS Transistors for Analog Applications, The 21st IEEE Convention of the Electrical and Electronic Engineers in Israel, Tel-Aviv, Israel, April 11-12, 2000.
  16. I. Brouk and Y. Nemirovsky, CMOS Image Sensor Device Characterization and Process-Control Monitoring (PCM) Methodology, Workshop on Active Pixel CMOS Sensors & Applications held at Tel-Aviv University, May 25, 2000, Tel Aviv, Israel.
  17. I. Brouk and Y. Nemirovsky, Noise characterization of the 0.35 micron CMOS process implemented in regular and SOI wafers, 11th IEEE International Conference on Electronics, Circuits and Systems, Tel Aviv, December 2004.
  18. I. Brouk and Y. Nemirovsky, CMOS image sensors, 11th IEEE International Conference on Electronics, Circuits and Systems, Tel Aviv, December 2004.